SAE J2052-2016

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Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

standard by SAE International, 07/12/2016

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SAE J2052 – 2016 Edition – Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

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Published:
07/12/2016
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1 file , 170 KB
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