SAE J2052-2011
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Test Device Head Contact Duration Analysis
standard by SAE International, 01/05/2011
SAE J2052 – 2011 Edition – Test Device Head Contact Duration Analysis
This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.The purpose of this SAE Information Report is to describe a computer-adaptable technique for determining head engagement and disengagement times for use in the calculation of the HIC without reliance on contact switches or photography.
Product Details
- Published:
- 01/05/2011
- File Size:
- 1 file , 60 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
