
SAE J1752/1-2016
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Electromagnetic Compatibility Measurement Procedures for Integrated Circuits – Integrated Circuit EMC Measurement Procedures – General and Definitions
standard by SAE International, 05/24/2016
SAE J1752/1 – 2016 Edition – Electromagnetic Compatibility Measurement Procedures for Integrated Circuits – Integrated Circuit EMC Measurement Procedures – General and Definitions
This SAE Recommended Practice provides supporting information for the emission and immunity measurement procedures defined in the SAE J1752 series of documents.
Product Details
- Published:
- 05/24/2016
- File Size:
- 1 file , 270 KB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus