SAE AS6171/2
Original price was: $117.00.$70.00Current price is: $70.00.
Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods
standard by SAE International, 10/30/2016
SAE AS6171/2 – Techniques for Suspect/Counterfeit EEE Parts Detection by External Visual Inspection, Remarking and Resurfacing, and Surface Texture Analysis Test Methods
This document describes the requirements of the following test methods for counterfeit detection of electronic components:
a. Method A: General External Visual Inspection (EVI), Sample Selection, and Handling
b. Method B: Detailed EVI
c. Method C: Testing for Remarking and Resurfacing
d. Method D: Surface Texture Analysis by SEM
NOTE: The scope of this document was focused on leaded electronic components, microcircuits, multi-chip modules (MCMs), and hybrids. Other electronic components may require evaluations not specified in this procedure. Where applicable this document can be used as a guide but additional inspections or criteria would need to be developed and documented to thoroughly evaluate these additional part types.
Product Details
- Published:
- 10/30/2016
- File Size:
- 1 file , 4.8 MB
- Note:
- This product is unavailable in Ukraine, Russia, Belarus
